The X-ray stress constants of five crystalline planes of beryllium were measured by using a cantilever beam loading method on X2001 stress analyzer. The results show that the X-ray stress constant of each plane in beryllium is different, so the X-ray stress constant corresponding to a diffraction plane must be adopted in order to acquire the exact stress value on X-ray stress analysis. Because of the rather large penetrate depth of X-rays into beryllium, that effect on X-ray stress constant measurement must be taken into account.
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董平 陈勇忠 柏朝茂.铍材应力常数的X射线法测试[J].稀有金属材料与工程,2004,33(4):445~448.[Dong Ping, Chen Yongzhong, Bai Chaomao. Measurement of X-ray Stress Constant of Beryllium[J]. Rare Metal Materials and Engineering,2004,33(4):445~448.] DOI:[doi]