7475铝合金微弧氧化后表面-界面能谱扫描分析

Energy Spectrum Scan Analysis of 7475 Aluminum Alloy Surface-interface by Micro Arc Oxidation

摘要:

利用微弧氧化法在7475铝合金表面制备一层氧化膜，通过SEM、EDS、XRD等手段对表面-界面形貌、化学元素组成和物相进行了分析，用能谱仪对表面和结合界面进行了面扫描和线扫描分析，并用划痕法表征了氧化膜界面结合强度。结果表明，微弧氧化后7475铝合金表面形成一层粗糙多孔的氧化膜，其组成元素与氧化膜表面的物相相应分布；O原子以扩散形式与Al原子原位生长形成Al2O3，主要由α-Al2O3、γ-Al2O3组成，Si原子在表面氧化形成富集的Si-Al-O相；其界面由间隙层、致密层和膜-基过渡层组成，氧化膜厚度约为50μm。

Abstract:

The ceramic oxide film on the surface of 7475 aluminum alloy was prepared by micro arc oxidation. The surface and interface morphology, chemical composition and phase were analyzed via SEM, EDS, XRD and etc. Energy spectrum analysis was conducted to analyze the distribution of chemical composition on the surface and interface. Adhesion strength of ceramic oxide film interface was measured by scratch. The results show that a layer of rough porous ceramic oxide film, whose chemical element is distributed correspondingly with its phase, is formed on the surface of 7475 aluminum alloy by micro arc oxidation. The Al2O3 mainly composed of α-Al2O3 and γ-Al2O3 is formed on the Al base by combining with diffusing O atoms, while the enrichment of Si atoms forms Si-Al-O phase. The ceramic oxide film is composed by gap layer, dense layer and film-substrate layer with thickness of about 50 μm.