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Microstructure of Ti(C,N) Films Coated by Pulsed-d.c PCVD
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TG149

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    Abstract:

    Using pulsed DC plasma chemical vapor deposition technology, the Ti(C, N) films on H13 steel were prepared under different CH4 atmospheres. The cross-sections of the Ti(C,N) films were investigated by SEM, and the elements in the film were characterized by XRD and XPS .The results show that addition of C to TiN film prevents the growth of TiN grains and development of column structure. The Ti(C, N) can be composed of two phases of TiN and phase TiC.

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[Wang Xin, Ma Dayan, Ma Shengli, Xu Kewei. Microstructure of Ti(C, N) Films Coated by Pulsed-d. c PCVD[J]. Rare Metal Materials and Engineering,2004,33(2):204~206.]
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  • Received:
  • Revised:April 16,2002
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