Analysis of the Hardness for Cu/Ag Multilayers with Various Modulation Wavelengths
DOI:
Author:
Affiliation:
Clc Number:
Fund Project:
Article
|
Figures
|
Metrics
|
Reference
|
Related
|
Cited by
|
Materials
|
Comments
Abstract:
Cu/Ag多层膜;Hall-Petch关系;位错塞积模型;位错稳定性
Reference
Related
Cited by
Get Citation
[Cao Ke, Ren Fengzhang, Su Juanhua, Zhao Shiyang, Tian Baohong. Analysis of the Hardness for Cu/Ag Multilayers with Various Modulation Wavelengths[J]. Rare Metal Materials and Engineering,2011,40(12):2152~2155.] DOI:[doi]